Advanced Production Testing of RF, SoC, and SiP Devices by Joe Kelly

By Joe Kelly

That includes worthy enter from industry-leading businesses and highly-regarded specialists within the box, this first-of-its type source deals skilled engineers a entire figuring out of the complicated themes in RF, SiP (system-in-package), and SoC (system-on-a-chip) construction checking out which are severe to their paintings related to semiconductor units. The publication covers key size thoughts for semiconductor machine checking out and assists engineers in explaining those techniques to administration to assist reduce venture expense, time, and assets. in line with real-world event and jam-packed with time-saving equations, this in-depth quantity bargains execs useful details on crucial themes that experience by no means been provided in one reference sooner than.

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02 01 . 10) 24 Advanced Production Testing of RF, SoC, and SiP Devices Considering that most device data sheets specify a maximum input match of around –10 dB this would be an acceptable number for most devices. 2 Output Match On modern SoC devices, an output match measurement is performed to measure the output matching of the power amplifier. The point of this measurement is to determine how much of the power is actually absorbed by the load and not reflected. Values less than –10 dB are typically considered acceptable as an output match.

The filtering is commonly accomplished by use of surface acoustical wave (SAW) or ceramic filters. The filtered IF signal is then further downconverted to the baseband frequency, which is then digitized and demodulated in a DSP. Because the radio has two stages of downconversion, it is generally more complex and more expensive due to the extra components such as discrete SAW filters and voltage-controlled oscillator (VCO)/synthesizers. 1(a) shows the superheterodyne receiver [1]. 2 The Zero-IF Architecture In contrast, the homodyne, or zero-IF (ZIF), radio transceiver is a direct-conversion architecture, meaning that it utilizes one mixer stage to convert the desired signal directly to and from the baseband without any IF stages and without the need for external SAW filters.

Other standard specific tests that require modulated signals are ACLR [commonly performed for code division multiple access (CDMA) devices], bit error rate tests (commonly performed on Bluetooth devices), or error vector magnitude (EVM), which is frequently measured on devices that use orthogonal frequency division modulation (OFDM) such as Worldwide Interoperability for Microwave Access (WiMAX). A device-specific test is a test that is not performed because it is required according to the IEEE specification, but performed by the vendor to guarantee correct design of the device.

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